Keithley 052207 2Nano free download

File name 052207_2Nano.pdf

A GREAT ER M EA SU R E O F C O N F I D E N C E voltage of the transistor increases due to the built-in voltage in the gate capacitor; there- fore, the drain current decreases. Pulse testing can be one of two different types: voltage or current pulsing. Voltage pulsing produces much narrow- er pulse widths than current pulsing. This makes it more suitable for experiments in thermal transport where the time frame of interest is shorter than a few hundred nano- seconds. High amplitude accuracy and pro- grammable rise and fall times are necessary to control the amount of energy delivered to a nanodevice. Voltage pulsing is useful for transient analysis, charge trapping, and AC stress tests during reliability testing, as well Pulse Testing for as generating clock signals and simulating repeating control lines such as in memory read and write cycles. Nanoscale Devices Current pulsing is very similar to voltage pulsing. In this method, a specified current