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File name: | 4200 self_paced.pdf [preview 4200 self paced] |
Size: | 78 kB |
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Mfg: | Keithley |
Model: | 4200 self paced 🔎 |
Original: | 4200 self paced 🔎 |
Descr: | Keithley SCS 4200 4200 self_paced.pdf |
Group: | Electronics > Other |
Uploaded: | 29-02-2020 |
User: | Anonymous |
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Decompress result: | OK | |
Extracted files: | 1 | |
File name 4200 self_paced.pdf Customer Self-paced E-learning Sequence for Keithley Model 4200-SCS Semiconductor Characterization System Overview: This document gives the recommended sequence for customer self-paced e-learning and tooling setup that Keithley has found to be effective and efficient for training new users of the Keithley Model 4200-SCS Semiconductor Characterization System. Total time required: Approximately 2 hours. Prerequisites 1. It assumes the reader knows the measurement basics of using source-measure units. 2. It assumes the reader has general knowledge of best practices for standard testing of semiconductor devices such as a MOSFET. 3. It assumes the customer has access to a properly set up Keithley 4200-SCS running Windows XP. Information on doing that can be found in the Model 4200-SCS Startup Guide, Packing List PA-716 which is available on the internet at http://www.keithley.com/data?asset=5251 . 4. Review the system overview and introduction at http://www.keithley.com/data?asset=50733 . 5. This document has references to specific sections of the 94-page 4200-SCS Semiconductor Characterization System Quick Start Guide 4200-903-01 Rev. C / May 2006. The customer needs to have a copy of that document, which is available on the internet at http://www.keithley.com/data?asset=50695 . This document is organized into these 4 sections: |
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