Keithley ACS Lab-BasedAutomation AN free download

File name ACS Lab-BasedAutomation_AN.pdf

Number 2846 A Tektronix Company ACS Integrated Test System for Application Note Lab-Based Automation Series Introduction As time to market and cost of test pressures mount, efficiency of tool usage and test engineer productivity continue to be scrutinized. Increased automation is a common way to better leverage resources. The progression from single die testing on manual probers to single wafer testing with semi-automatic probers naturally leads to full cassette probing on automatic probers. Doing this kind of testing with the precision and flexibility of laboratory-based tools, but without the expense of production parametric test systems, has been difficult in the past. It usually encompassed significant amounts of custom code and specialized test stands as well as highly trained engineers to run the equipment. Keithley has the solution. Combining Keithley's Automated Characterization Suite (ACS) software with the Model 4200-SCS Parameter Analyzer provides the best of both worlds-- lab-level characterization and production automation. Industry-Leading Lab Characterization The Model 4200-SCS has been a leading tool in semiconductor labs for a variety of characterization and modeling tasks. Typical applications include standard DC I-V and C-V testing of test structures and devices like BJTs, FETs, and diodes. Multi- Figure 1. Example Model 4200-SCS running ACS and controlling a channel source capabilities up to 1A and 200V and measurement switch matrix. resolution down to 100 atto-Amps and 1