Keithley S680 broc free download

File name S680_broc.pdf

www.keithley.com S680 S680 The Next Generation of Parametric Test Performance A G R E A T E R M E A S U R E O F C O N F I D E N C E Parallel test and adaptive testing Minimize your test times Lights-out 40GHz production RF testing RF measurements as easy as DC Modular per-pin electronics Extendable platform Sub-femtoamp noise See more, faster Flexible SECS/GEM automation Integrates into your test floor operations The S680's flexible architecture ensures that, no matter what tomorrow's devices look like or how they perform, you'll be able to upgrade or reconfigure your tester cost-effectively to handle them. Taking on your next generation of test challenges Keithley can build an S680 tester optimized for your emerging We back up the S680 with a full staff of parametric test experts, parametric test requirements, including: who not only understand the physics of new materials and devices, but lead the industry in their knowledge of electrical n Advancedtransistorgatedielectrics. test instrumentation and test setup. They'll work closely with n RFs-parametermeasurementsatupto40GHz you to develop new measurement capabilities as new test forhighperformanceprocesses. needs emerge, so you can meet your process development and process ramp goals. n Copper/lowkmaterialssystems. Minimize your long-term cost of test by n Embeddedmemories,suchasferroelectric maximizing your capital equipment reuse andmagnetic-baseddevices. At Keithley, we're passionate about protecting your investment n Measurementsonadvancedsubstrates in our products. The S680's robust, modular design supports likeSOIandSiGe. highly cost-effective field upgrades. That means it will go n Femtoamp-levelDCmeasurementsfor on meeting your emerging measurement needs for many lowleakagemobiledevices. years to come. For example, the per-pin electronics in the S680's testhead that let you to make lab-grade DC and AC n Adaptiveandparalleltestingforimproved measurements on all 64 pins of a production tester today will throughputandreducedcostoftest. also support your on-w