File information: | |
File name: | S530 Brochure.pdf [preview S530 Brochure] |
Size: | 2059 kB |
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Mfg: | Keithley |
Model: | S530 Brochure 🔎 |
Original: | S530 Brochure 🔎 |
Descr: | Keithley SCS S530 S530 Brochure.pdf |
Group: | Electronics > Other |
Uploaded: | 13-03-2020 |
User: | Anonymous |
Multipart: | No multipart |
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Decompress result: | OK | |
Extracted files: | 1 | |
File name S530 Brochure.pdf S530 Semiconductor Parametric Test Systems Cost-effective, high throughput solutions n Low acquisition cost; low cost of ownership n Round-the-clock productivity n Readily adaptable to new devices and test requirements n Fast, flexible, interactive test plan development n Wide range of configuration and measurement options a g r e a t e r m e a s u r e o f c o n f i d e n c e S530 systems combine the speed and low acquisition cost your test floor demands today. . . . . . with the low cost of ownership, flexibility, and adaptability you'll need tomorrow. SMU SMU SMU SMU A B A B Processor Traditional "big iron" parametric testers are fine for ultra-high-volume (Master) Processor fabs that only test a limited number of processes and products using Processor System TSP Bus To lower voltages and currents. But for a growing number of fabs, they're Controller Switch |
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