Keithley 2813 Mesatronic1 free download

File name 2813 Mesatronic1.pdf

A G R E AT E R M E A S U R E O F C O N F I D E N C E However, Keithley Instruments and Mesa- tronic Group (Voiron, France) have formed a technical alliance that is blazing new trails in the quest for small geometry, mixed RF and DC testing. Engineers from the two companies are working together to create probe cards for parametric test systems that take RF and low level DC measure- ments on any combination of wafer prober pins. Project objectives include easier layout and manufacture of the probe cards, shorter production times, and ultimately lower cost to parametric test users. In addition, users should be able to reduce their probe card in- Enabling ventory by using one card design for many different applications. Simultaneous Rf and Semiconductor Wafer Trends Because of today's fast switching digital devices and their combination with RF ana- Dc Measurements log devices on the same wafer, wafer level RF testin