Keithley 4200 e-book11-10-09 free download

File name 4200_e-book11-10-09.pdf

New Test Methods for the r&d Lab Learn how to solve 2009's toughest electrical measurement problems w w w. k e i t h l e y. c o m a g r e at e r m e a s u r e o f c o n f i d e n c e f e at u r e d a p p l i c at i o n optimize your low current measurements For applications like determining the gate leakage current of FETs or testing sensitive nanoelectronic devices, you need to measure picoamps of current or less with high accuracy. To make these measurements successfully, you'll not only need a very sensitive ammeter but the knowledge to choose the proper measurement settings, select low noise fixtures and cabling, allow sufficient settling time, and use techniques that prevent unwanted currents from reducing accuracy. Learn more. Learn how to make better low current measurements faster. Read our online application note. Shielded vs. unshielded measurements on a 100G resistor Need advice on your application? n Click here or n Email [email protected] VIEW THE WEBINAR: How to Get the Most from Your Low Current Measurement Instruments v i e w a p p L i c at i o n n o t e view our onLine webinar emaiL us w w w. k e i t h l e y. c o m a g r e at e r m e a s u r e o f c o n f i d e n c e simplify your low current measurements with the model 4200-ScS d o w n L o a d t e c h n i c a L d ata b o o k emaiL us The Model 4200-SCS Semiconductor Characterization System delivers best-in-class DC, CV, and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. Its self- documenting, point-and-click interface speeds and simplifies taking data, so you can start analyzing your results sooner. n Remote preamps extend current measurement resolution to 0.1fA. n High speed, high precision A/D converter for each DC channel eliminates measurement tradeoffs