Agilent Release Note SW 253B A.05.04.2013.0328 ReleaseNotes SW A0504 20130328 free download

File name Release Note SW_253B A.05.04.2013.0328 ReleaseNotes_SW_A0504_20130328.txt

== Agilent B1500A/B1505A Software A.05.04.2013.0328 Release Notes == == CORRESPONDING FIRMWARE REVISION == This software A.05.04.2013.0328 works with the following firmware. - B1500A/B1505A: A.05.04 or later. - 415xB/C: HOSTC 03.08, SMUC 04.08 or later. == FIXED DEFECTS == Following defects are fixed in this release A.05.04.2013.0328 - [8972] [Oscilloscope View] Delay may increase unexpectedly for each measurement in case of duration above 4ms. == REVISION HISTORY == New Features: - [8932] [ER12I-149] EasyEXPERT: Readout function to refer the latest AutoAnalysis Result on ASSIGN. - "Ic-Ib for Expanders" and "G-Plot for Expanders" are added in the PowerBJT category of Application Library. Fixed Defects: - [8752] EasyEXPERT database restoration may fail. - [8925] [N1268A Support] Unexpected error 1004 may occur depending on pulse base and peak settings. - [8927] [N1265A/N1266A/N1268A Support] Standby Channel Definition may be left disabled after losing communication with expanders. - [8929] [UHCU 500A Version Support] Recalling or importing fails for setups using UHCU of 500A version. - [8933] [N1267A Support] Time offset definition in Signal Monitor application tests for GaN Current Collapse is different from Oscilloscope View. - [8934] Error occurs for exporting test result of empty Tracer Test setup. - [8940] [Tracer Test] Changing IPULSE VAR2 channel to VAR1 channel may cause persistent error messaging. - [8944] [UHCU/HVMCU/UHVU Support] Power compliance for VAR2 channel is not based on measured values. Fixed Defects: - [8929] [UHCU 500A Version Support] Recalling or importing fails for setups using UHCU of 500A version. Fixed Defects: - [8839] [Oscilloscope View] Time domain may not be set to 5us/div by enter key. - [8850] [C-V Sweep] For imported C-V Sweep setup, CONST SMU channel source setting may be reset to 0 depending on the order in channel definition. - [8852] [N1267A Support] 0V is output for Gate instead of GateOff setting for FET Current Collapse Signal Monitor Application Test. - [8855] [Classic Test] Channel Setting in Advanced Setup dialog may miss and duplicate SMU channels depending on GNDU order in Channel Definition. - [8856] [Database] database may corrupt by saving App Test Definition during measurement. - [8858] [EasyEXPERT for 415x] Error may occur with execution Application Test imported from Test Setup file. - [8862] SMU/PG Selector setting and ASU I/O Path setting are not restored at the opening of a worksapce. - [8864] Recovery from non-numeric input for numeric field needs keyboard. - [8866] [Auto/Folder Export] Access Control List of index.txt is not derived from the target folder. - [8868] [N1268A Support] Diagnosis may end up with timeout error in case of wrong V Control SMU conn