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File name: | 5600LS AFM Enhanced Sample Versatility_ 2-Inch Multi-Sample Wafer Vacuum Chuck 5991-2015EN c20140723 [preview 5600LS AFM Enhanced Sample Versatility 2-Inch Multi-Sample Wafer Vacuum Chuck 5991-2015EN c20140723] |
Size: | 130 kB |
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Mfg: | Agilent |
Model: | 5600LS AFM Enhanced Sample Versatility 2-Inch Multi-Sample Wafer Vacuum Chuck 5991-2015EN c20140723 🔎 |
Original: | 5600LS AFM Enhanced Sample Versatility 2-Inch Multi-Sample Wafer Vacuum Chuck 5991-2015EN c20140723 🔎 |
Descr: | Agilent 5600LS AFM Enhanced Sample Versatility_ 2-Inch Multi-Sample Wafer Vacuum Chuck 5991-2015EN c20140723 [2].pdf |
Group: | Electronics > Other |
Uploaded: | 30-06-2021 |
User: | Anonymous |
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Extracted files: | 1 | |
File name 5600LS AFM Enhanced Sample Versatility_ 2-Inch Multi-Sample Wafer Vacuum Chuck 5991-2015EN c20140723 Keysight 5600LS AFM Enhanced Sample Versatility: 2-Inch Multi-Sample Wafer Vacuum Chuck The Keysight Technologies, Inc. 5600 LS AFM, already one of the most versatile atomic force microscopy systems on the market (with a fully programmable 200 mm stage that allows complete access over a full 200 mm in X/Y travel), has added yet another highly useful configuration. A new 2" (52 mm) multi-sample wafer vacuum chuck can now be added to the Keysight 5600 LS AFM, providing system users the ability to image up to one dozen 2" wafers. Important to the growing LED market (e.g., GaN devices on sapphire substrates) and to a variety of optoelectronics devices on InP and GaAs wafers, this multi-sample wafer vacuum chuck option allows unattended automation of imaging and measuring up to 12 samples. Ideal for process development and monitoring, the Keysight 5600 LS AFM has a high-precision 200 mm X/Y stage and built-in automation to create complex automated imaging on multiple samples. Whether you are monitoring an existing process or working to deine a new generation of devices, the Keysight 5600 LS AFM offers powerful tools and imaging modes to deliver uncompromising performance on your samples. Contact your sales representative today for more information or to receive a quotation for this new option Topography images of GaN ilms grown on sapphire. Bottom image shows local defects circled in red. The programmable stage allows user to pre-select points on each wafer that are to be imaged. AFM Instrumentation from Keysight Keysight Technologies offers high- precision, modular AFM solutions for research, industry, and education. Exceptional worldwide support is provided by experienced application scientists and technical service personnel. Keysight's leading-edge R&D laboratories are dedicated to the timely introduction and optimization of innovative and easy-to-use AFM technologies. www.keysight.com/find/afm For more information on Keysight Technologies' products, applications or services, please contact your local Keysight office. The complete list is available at: www.keysight.com/find/contactus Americas Canada (877) 894 4414 Brazil 55 11 3351 7010 Mexico 001 800 254 2440 United States (800) 829 4444 Asia Paciic Australia 1 800 629 485 China 800 810 0189 Hong Kong 800 938 693 India 1 800 112 929 Japan 0120 (421) 345 Korea 080 769 0800 Malaysia 1 800 888 848 Singapore 1 800 375 8100 Taiwan 0800 047 866 Other AP Countries (65) 6375 8100 Europe & Middle |
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