Agilent 5991-3093EN Protect Against Power-Related DUT Damage During Test - Application Note c20141107 [6] free download

File name 5991-3093EN Protect Against Power-Related DUT Damage During Test - Application Note c20141107 [6].pd

Keysight Technologies Protect Against Power-Related DUT Damage During Test Application Note Overview If you want to meet your delivery and budget goals, it is important to protect your devices against damage during test, especially for high-value aerospace/defense and automotive devices, but also for any devices that are time consuming and costly to replace. When the risk of device damage is of signiicant concern, test planning should include strategy and equipment that can help to reduce such risk. Choosing a power supply with extensive integrated protection features is the best way to avoid power-related damage to your DUT and to reduce test-system development investment by minimizing overall system hardware. In this application note, we will look at how the extensive protection features of the new Advanced Power System from Keysight Technologies, Inc. can protect your DUT from costly damage. Problem Controlling power supply output voltage and current to avoid overstressing the DUT under fault or near-fault conditions requires a rapid and effective response to a variety of situations. The primary causes of DUT failure are over-voltage and over-current events, some of which are very short duration while others endure until they are discovered. An over-voltage or over-current event can occur for a variety of reasons, including: