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File name: | 2622 WLR.pdf [preview 2622 WLR] |
Size: | 208 kB |
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Mfg: | Keithley |
Model: | 2622 WLR 🔎 |
Original: | 2622 WLR 🔎 |
Descr: | Keithley Appnotes 2622 WLR.pdf |
Group: | Electronics > Other |
Uploaded: | 07-03-2020 |
User: | Anonymous |
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Extracted files: | 1 | |
File name 2622 WLR.pdf Reliability "Bathtub Curve" A G R E AT E R M E A S U R E O F C O N F I D E N C E Failure Lifetime Rate Failure Area Time Figure 1. Typical semiconductor reliability curve. Stress-measure testing is a common tech- nique used to evaluate operating lifetimes Wafer Level Reliability and wear-out failure mechanisms in semi- conductor devices. This testing is focused on failures on the right side of the typical Testing |
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